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Characterization of Thin Polymer Films by X-ray Reflectometry with Synchrotron Radiation.

Characterization of Thin Polymer Films by X-ray Reflectometry with Synchrotron Radiation. Research Abstract Details 

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  • Characterization of Thin Polymer Films by X-ray Reflectometry with Synchrotron Radiation. Abstract Text:

    k kagoK Kago,h endoH Endo,h matsuokaH Matsuoka,h yamaokaH Yamaoka,n hamayaN Hamaya,m tanakaM Tanaka,t moriT Mori,

    X-ray reflectivity (XR) measurements with a synchrotron radiation source were carried out for thin polymer films on a glass plate. From the XR data, the film thickness and surface and interface roughnesses could be determined. In addition, the appropriate conditions and precision for measurements were also discussed. Kiessig fringes were observed clearly for specular XR measurements of poly(methylmethacrylate) thin film. Analysis of the XR data allowed the determination of the film thickness very precisely. By a curve-fitting procedure of the XR profile, the film-surface roughness and film-substrate interface roughnesses were determined. A Fourier transform of the XR data was performed as an alternative method of evaluating the film thickness. The values for the film thickness obtained by the curve-fitting procedure and Fourier-transform procedure were slightly different from each other. One possibility for the cause of this difference may be an integral error and/or cut-off effect in the Fourier-transform procedure. The XR technique with synchrotron radiation is a very powerful tool for structural characterization of thin polymer films.

    Characterization of Thin Polymer Films by X-ray Reflectometry with Synchrotron Radiation. Publishing Authors By Initials

    k kagoK Kago,h endoH Endo,h matsuokaH Matsuoka,h yamaokaH Yamaoka,n hamayaN Hamaya,m tanakaM Tanaka,t moriT Mori,

    For similar abstracts research abstracts see: abstracts research

    PUBMED ID PMID:

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    Characterization of Thin Polymer Films by X-ray Reflectometry with Synchrotron Radiation. Journal Published:

    PUBLICATION TYPE: Journal Article

    Journal: Journal of synchrotron radiation

    VOLUME: 5

    Page Numbers: 1304-8

    Journal Abbreviation:

    ISSN: 0909-0495

    DAY: 1

    MONTH: Sep

    YEAR: 1998

    Characterization of Thin Polymer Films by X-ray Reflectometry with Synchrotron Radiation. Information

    Number of References:

    LANGUAGE: eng

    NlmUniqueID: 9888878

    Characterization of Thin Polymer Films by X-ray Reflectometry with Synchrotron Radiation. Keywords Mesh Terms:

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    Grant and Affiliation Information for Characterization of Thin Polymer Films by X-ray Reflectometry with Synchrotron Radiation.

    AFFILIATION: Department of Polymer Chemistry, Kyoto University, Kyoto 606-8501, Japan.

    Country: Denmark

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    MEDLINETA: J Synchrotron Radiat

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